Field Ion Microscopy System

Tip preparation is essential to achieve stable and reproducible tunneling results, especially in tunneling spectroscopy. We have constructed a microscope system that allows field emission microscopy (FEM) or field ion microscopy (FIM) operation. In FEM operation we have a superimposed positive pulse capability of field evaporation cleaning during FEM imaging. The system also allows for tip cleaning using resistive heating. The system doubles as a load-lock for sample and tip introduction to the entire system.

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Online: May 2000
Last Updated: July 2007