Center for Nanoscale Science & Technolgy home page NIST home page Electron Physics Group home page Electron Physics Group Research Areas page Electron Physics Group Publications page Collaborative Research Facilities page Electron Physics Group Staff page Electron Physics Group What's New page
• Nanomagnetics
• Atomic scale characterization & fabrication
• Modeling nanostructures in mesoscopic environments
• Nanoscale measurement & fabrication using laser-controlled atoms
• Atom Optics
• Magneto-Optic Microscopy
• Magnetic Force Microscopy
• Nanoscale Physics
• SEMPA
• UHV STM

Atom lithography with metastable atoms and H-passivated Si



In addition to demonstrating the feasibility of patterning surfaces by exposing self-assembled monolayers of alkanethiolates to metastable atom impact, we have also shown that metastable atoms can form a pattern in hydrogen-passivated silicon. This opens the possibility of an organic-free lithography process that can take advantage of all the capabilities of atom optics and also have an extremely small inherent "graininess" that is limited only by the size of a single hydrogen atom.

As with metastable lithography using alkanethiolates, the exposure mechanism relies on the deposition of internal metastable energy from the atoms as they strike the surface. In this case, the energy goes into breaking the bond between the hydrogen atoms and the silicon surface. Once this bond is broken oxide can form, which can serve as an etch resist. Alternatively, metal atoms can be deposited and they will only bond to the silicon where the hydrogen has been removed, opening the possibility of direct growth of metallic structures.

In our experiments, [EPG pub# 702] we have directed a beam of metastable Ar(3P0,2) though a grid onto a hydrogen-passivated silicon surface prepared by dipping in HF. After exposure, the vacuum system is back-filled with O2 and then the sample is removed and placed in a KOH etch. Clear etching is observed in the regions not impacted by metastable atoms.

This work is the first step in demonstrating a new fabrication approach. As the techniques of atom optics develop, advantages such as a high degree of parallelism and sub-100 nm resolution may bring this approach into play in some areas of nanoscale manufacturing.

microscope image of a silicon surface



Related Publication Listing
Patterning of Hydrogen-Passivated Si(100) Using Ar(3P0,2) Metastable Atoms

Staff listings
Jabez J. McClelland - NIST
Robert J. Celotta - NIST

Collaborators listing
Harold Craighead - Cornell University
Christian Haich - Rice University
F. Barry Dunning - Rice University
G. King Walters - Rice University

Staff listings
Shannon Hill - NIST


Online: July 1999
Last Updated: February 2008

Website Comments:egpwebmaster@nist.gov