Magnetic properties of thin film edges
 Figure 1. Modeled mode profiles in a 250 nm wide, 25 nm thick
Permalloy stripe magnetized perpendicular to the stripe axis. The edge
mode is localized within roughly 30 nm of the edge. |
 Figure 2. Measured resonances as a function of applied field for an
array of 40 nm thick Permalloy stripes. The low frequency mode is the edge
mode. |
Around the perimeter of every patterned magnetic nanodevice is a thin film edge, and the properties of the film edge are important for the performance of the device. For 2D-like thin films, a large number of properties and measurement techniques are available to describe the behavior of the magnetization. For 1-D like thin film edges, however, even the vocabulary to describe magnetic edge properties has been lacking. In this project we develop measurement methods and data needed to understand and control the behavior of magnetism near thin film edges. Primarily, we use microwave spectroscopy methods to measure the precession (vibration) frequency of the magnetization, taking advantage of the fact that the edge magnetization resonates at a lower frequency than the interior of the film. Using this spectroscopy technique we are able to measure the effects of different lithographic processing techniques on the magnetic properties of the edges.
Characterization of magnetic properties at edges by edge-mode dynamics
Thin Film Edge Property Measurements by Edge Saturation
Modeling of ideal and nonideal magnetic film edges
Variation of magnetic edge properties with patterning process conditions
Thickness dependence of magnetic film edge properties in Ni80Fe20 stripes
David Abraham - IBM
Vivian Chuang - MIT
Joy Y. Cheng - MIT, Hitachi GST
Cindi Dennis - NIST
June W. Lau - NIST
Brian Maranville - NIST
Caroline Ross - MIT
Online: January 2008
Last Updated: February
2008
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