Physical Review Letters 42(20), 1349-1352 (1979)
The first low-energy-electron diffraction measurements using a polarized incident electron beam are reported and compared to measurements where an unpolarized incident beam is analyzed after scattering. Whereas, because of multiple scattering, equivalence of the two measurements is not expected in general, excellent agreement, is obtained for specular scattering in the (010) plane from W(100). A theoretical argument is presented for the case where the scattering plane is a mirror-symmetry plane of the crystal.
Center for Nanoscale Science and Technology
NIST is an agency of the U.S. Department of Commerce
Website Comments:epgwebmaster@nist.gov