In Proceedings of the NSF/CNRS Workshop on Electron Beam Induced High Spatial Resolution Spectroscopies, Aussois, France, March 1988, ed. by M. Isaacson and C. Colliex (1988) p. 116.
The scanning electron microscopy with polarization analysis (SEMPA) technique as a means of observing magnetic microstructure is surveyed. A brief description of the technique is given. Particular emphasis is paid to the spin-polarization detector as the critical element in the SEMPA system.
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