AIP Conference Proceedings: 2007 International Conference on Frontiers of Characterization and Metrology 931, 472-476 (2007)
Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides high resolution (10 nm) magnetization images simultaneously with, but independent of, the topography. Such information is very useful in studying spintronics devices as illustrated by three examples: 1) exchange coupling of magnetic layers, 2) spin-transfer switching in magnetic nanowires, and 3) the ferromagnetic metal-semiconductor interface.
Center for Nanoscale Science and Technology
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